SPIP 4.6.0

Image Metrology's SPIP (Scanning Probe Image Processor) software is a powerful tool for analyzing scanning probe microscopy (SPM) data. With an intuitive user interface, SPIP allows users to process, analyze, and visualize SPM data from a variety of instruments, including atomic force microscopy (AFM), scanning tunneling microscopy (STM), and more.

Using SPIP, researchers and engineers can perform a range of analyses on SPM data, such as 2D and 3D surface visualization, image processing, statistical analysis, and more. The software also has advanced features like automatic particle detection, line profile measurements, and nanomechanical analysis, making it an essential tool for anyone working in materials science, physics, or nanotechnology.

• Highly intuitive user interface for easy navigation and data analysis
• Compatible with a variety of SPM instruments and data formats
• Advanced image processing capabilities for clearer and more detailed data visualization
• Automatic particle detection and comprehensive statistical analysis tools
• Nanomechanical analysis tools for quantitative characterization of surface properties

With its diverse range of features and compatibility with multiple SPM instruments and data formats, SPIP is an indispensable tool for anyone performing SPM research.